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Home » GaN e-Beam inspection

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GaN e-Beam inspection

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Photo electron Soul’s GaN e-Beam Innovation Gains Kioxia’s Nod for Testing

by EC Editor September 2, 2025

by EC Editor September 2, 2025

Kioxia Iwate Corp., a unit of Japanese memory chipmaker Kioxia Holdings, will begin evaluating next-generation inspection and metrology technology jointly developed by…

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